| 摘要 |
PROBLEM TO BE SOLVED: To provide a device inspection method, a device inspecting apparatus and a TAB tape, which improve an inspection speed, when inspecting devices arrayed on a tape. SOLUTION: The TAB tape 1, wherein a plurality of devices 2 are arranged on the tape in the width direction, is driven in its longitudinal direction, whereby the plurality of devices 2 arranged on the tape in the width direction are conveyed to an inspection position. Then, probe pins are simultaneously connected electrically to the plurality of devices 2 conveyed to the inspection position, and the plurality of devices 2 are simultaneously inspected. Therefore, the inspection speed can be improved, in comparison with the case where one device is inspected in one cycle. A wired pattern 3 connected to pins of the devices 2 is formed on the TAB tape 1, and the plurality of devices 2 are connected electrically to the probe pins, by bringing the probe pins to come into contact with the wired pattern 3. COPYRIGHT: (C)2006,JPO&NCIPI
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