发明名称 ANALYZING APPARATUS FOR REDUCING AND VAPORIZING ELEMENT
摘要 PURPOSE:To save time, reagent, and sample, by introducing the sample into a mixing part yielding hydrogen quickly by a pressurized inactive gas in the case of fixed wavelength analysis, and continuously introducing the sample into a mixing part in the case of a wavelength scanning method. CONSTITUTION:In the case of fixed wavelength analysis such as atomic absorption analysis, reagents 1 and 2 are sent to a manifold (mixing part) 17 by constant quantity pumps 5 and 6. A carrier 3 and a sample 4 are sent by a constant quantity liquid feeding pump 8 through a solenoid valve 7. Measurement is performed in a measuring part between the solenoid valves 7 and 13. Then, the sample is made to flow into the mixing part 17 quickly through a connecting device 15 by the pressure of argon gas based on the operation of a timer (not shown). In the case of a wavelength scanning method such as ICP light emitting analysis, the sample (set at the position of the carrier 3) is continuously sent to the mixing part 17 by the constant quantity liquid feeding pump 8. The sample is atomized in an ICP27, and the light emission measurement is performed.
申请公布号 JPS60102542(A) 申请公布日期 1985.06.06
申请号 JP19830209003 申请日期 1983.11.09
申请人 HITACHI SEISAKUSHO KK 发明人 HARADA KATSUHITO;YONETANI AKIRA;OKAMURA KIYOUMI
分类号 G01N21/31;G01N21/73 主分类号 G01N21/31
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