发明名称 Copper interconnect
摘要 An improved wire bond with the bond pads of semiconductor devices and the lead fingers of lead frames or an improved conductor lead of a TAB tape bond with the bond pad of a semiconductor device. More specifically, an improved wire bond wherein the bond pad on a surface of the semiconductor device comprises a layer of copper and at least one layer of metal and/or at least a barrier layer of material between the copper layer and one layer of metal on the copper layer to form a bond pad.
申请公布号 US2006055060(A1) 申请公布日期 2006.03.16
申请号 US20050267712 申请日期 2005.11.04
申请人 发明人 AKRAM SALMAN
分类号 H01L23/48;H01L21/60;H01L23/485;H01L23/495 主分类号 H01L23/48
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