发明名称 THICKNESS MEASURING DEVICE AND METHOD
摘要 PROBLEM TO BE SOLVED: To always accurately and quickly measure the thickness of a plate being a measuring object, irrespective of the material quality, hardness, and the area of the plate. SOLUTION: The thickness of the transparent plate is calculated on the basis of the relation between thickness and spherical aberration in a reference basal plate, by using the spherical aberration component of an interference fringe to be obtained by light reflected by a reference face, and light reflected by the rear face of the transparent plate arranged at a predetermined position after permeating the reference face and having permeated the reference face again. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006058063(A) 申请公布日期 2006.03.02
申请号 JP20040238142 申请日期 2004.08.18
申请人 PENTAX CORP 发明人 HAGIWARA YUKIO
分类号 G01B11/06 主分类号 G01B11/06
代理机构 代理人
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