发明名称 IMMERSION ALIGNER AND ITS METHOD, AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To realize highly accurate levelling measurement in the following exposure area adjacent to an immersion lithography area by one shot. <P>SOLUTION: In immersion lithography, an image projecting from a reticle is transferred onto a photosensitive surface 20A while a liquid 40 is held between a projection optics and the photosensitive surface 20A on a substrate 20. When the immersion lithography is repeated while changing an exposure area sequentially within the photosensitive surface 20A, a liquid holding frame 30 is provided to hold a liquid 40 for a part of a substrate facing surface 5A of a projection optics 5B. Thus, one exposure area EAx is included in a portion being in contact with the liquid 40 of the photosensitive surface 20A, and at least a part of a following exposure area EAx+1 adjacent to the exposure area becomes in non-contact with the liquid 40. Therefore, pre-read levelling in air is made possible. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006059860(A) 申请公布日期 2006.03.02
申请号 JP20040237329 申请日期 2004.08.17
申请人 SONY CORP 发明人 UESAWA FUMIKATSU;TAKEUCHI KOICHI
分类号 H01L21/027;G03F7/20;G03F9/02 主分类号 H01L21/027
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