发明名称 Method of fabricating semiconductor device
摘要 A protective film is formed on a surface of a semiconductor device corresponding to at least a portion that is not to be disordered, by arranging a heat source on a path through which a precursor of the protective film to be formed passes, to cause a decomposition reaction of the precursor in the presence of the heat source, and by exposing the surface of the semiconductor device to the atmosphere after the decomposition reaction. A portion to be disordered is disordered using a thermal treatment.
申请公布号 US2006039430(A1) 申请公布日期 2006.02.23
申请号 US20050249386 申请日期 2005.10.14
申请人 MITSUI CHEMICALS, INC. 发明人 YAMADA YUMI;IZUMI AKIRA
分类号 H01L21/324;H01S5/00;H01L21/26;H01S3/04;H01S5/028;H01S5/16 主分类号 H01L21/324
代理机构 代理人
主权项
地址