Method and apparatus for a TFT array

摘要

A testing method for a TFT array substrate arranging pixels in a matrix where a pixel comprises a pixel selection transistor having a gate formed from a first structural material and a source and a drain formed from a second structural material, and a drive transistor having a gate formed from the first structural material and a source and a drain formed from the second structural material, wherein the testing method comprises: a first step for applying a first voltage to the drain of the pixel selection transistor and initializing the source voltage; a second step for applying a second voltage to the drain of the pixel selection transistor and measuring the current flowing between the drain and source of the pixel selection transistor; and a third step for determining the on-state resistance of the pixel selection transistor from the current and the potential difference between the first voltage and the second voltage.