发明名称 ELECTRON MICROSCOPE PHASE ENHANCEMENT
摘要 <p>A microfabricated electron phase shift element (100) is used for modifying the phase characteristics of an electron beam (410) passing though its center (190), while not affecting the more divergent portion of an incident beam. One application of the element is to increase the contrast of an electron microscope for viewing weakly scattering samples while in focus. Typical weakly scattering samples include biological samples such as macromolecules, or perhaps cells.</p>
申请公布号 WO2006017252(A1) 申请公布日期 2006.02.16
申请号 WO2005US24601 申请日期 2005.07.12
申请人 THE REGENTS OF THE UNIVERSITY OF CALIFORNIA;GLAESER, ROBERT;JIN, JIAN 发明人 GLAESER, ROBERT;JIN, JIAN
分类号 H01J37/26 主分类号 H01J37/26
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