发明名称 |
ELECTRON MICROSCOPE PHASE ENHANCEMENT |
摘要 |
<p>A microfabricated electron phase shift element (100) is used for modifying the phase characteristics of an electron beam (410) passing though its center (190), while not affecting the more divergent portion of an incident beam. One application of the element is to increase the contrast of an electron microscope for viewing weakly scattering samples while in focus. Typical weakly scattering samples include biological samples such as macromolecules, or perhaps cells.</p> |
申请公布号 |
WO2006017252(A1) |
申请公布日期 |
2006.02.16 |
申请号 |
WO2005US24601 |
申请日期 |
2005.07.12 |
申请人 |
THE REGENTS OF THE UNIVERSITY OF CALIFORNIA;GLAESER, ROBERT;JIN, JIAN |
发明人 |
GLAESER, ROBERT;JIN, JIAN |
分类号 |
H01J37/26 |
主分类号 |
H01J37/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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