Semiconductor memory devices and method of sensing bit line thereof

摘要

A semiconductor memory device and a bit line sensing method thereof are disclosed. The semiconductor memory device includes a first memory cell connected between a first word line accessed by a first address and an inverted bit line; a second memory cell connected between a second word line accessed by a second address and a bit line; a first type sense amplifier serially connected between the bit line and the inverted bit line and having a first type first MOS transistor sensing the inverted bit line and a first type second MOS transistor sensing the bit line if a first enable signal of a first voltage is applied; a second type first sense amplifier serially connected between the bit line and the inverted bit line and having a second type first MOS transistor sensing the inverted bit line and a second type second MOS transistor sensing the bit line if a second enable signal of a second voltage is applied, wherein the second type first MOS transistor has a better sensing ability than the second type second MOS transistor; and a second type second sense amplifier serially connected between the bit line and the inverted bit line and having a second type third MOS transistor sensing the inverted bit line and a second type fourth MOS transistor sensing the bit line if a third enable signal of the second voltage is applied, wherein the second type fourth MOS transistor has a better sensing ability than the second type third MOS transistor.