| 摘要 |
A waveform shaping part of a test device has a 1a delay circuit for delaying a set signal that controls the timing of a first change point of a test signal; a 1b delay circuit for delaying a reset signal that controls the timing of a second change point of the test signal as caused to change by the set signal as delayed by the 1a delay circuit; a 2a delay circuit for delaying a set signal that controls the timing of a third change point of the test signal; a 2b delay circuit for delaying a reset signal that controls the timing of a fourth change point of the test signal as caused to change by the set signal as delayed by the 2a delay circuit; a 3a delay circuit for delaying a set signal that controls the timing of a first change point of an enable signal to be applied to a diver; and a 3b delay circuit for delaying a reset signal that controls the timing of a second change point of the enable signal to be applied to the diver during a predetermined cycle of a cycle reference signal.
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