APPARATUS FOR MEASURING OPTICAL PROPERTIES OF THIN METAL FILM AND METHOD THEREFOR,申请号KR20040055157-传众专利搜索

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发明名称	APPARATUS FOR MEASURING OPTICAL PROPERTIES OF THIN METAL FILM AND METHOD THEREFOR
摘要
申请公布号	KR20060006243(A)	申请公布日期	2006.01.19
申请号	KR20040055157	申请日期	2004.07.15
申请人	KIM, KWANG TAEK;HWANGBO, SEUNG	发明人	KIM, KWANG TAEK;HWANGBO, SEUNG
分类号	G01N21/62	主分类号	G01N21/62
代理机构		代理人
主权项
地址

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