发明名称 SEMICONDUCTOR DEVICE MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a method for manufacturing semiconductor devices that enables small, inexpensive, high performance, and high value-added bipolar transistors to be easily manufactured in the CMOS process. SOLUTION: This method partially removes a thick Locos oxide film formed on the well by using a mask for forming the emitter P<SP>+</SP>domain, then injects P<SP>+</SP>impurity in the second silicon surface from which this oxide film has been removed so that the P<SP>+</SP>emitter domain can be formed in a deep location of the silicon. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006019519(A) 申请公布日期 2006.01.19
申请号 JP20040195889 申请日期 2004.07.01
申请人 SEIKO INSTRUMENTS INC 发明人 SAITO NAOTO
分类号 H01L27/06;H01L21/331;H01L21/8249;H01L29/732 主分类号 H01L27/06
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