发明名称 |
CONTACT TERMINAL, ITS MANUFACTURING METHOD, PROBE CARD EQUIPPED WITH THE CONTACT TERMINAL, AND ELECTRONIC DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a contact terminal having a small number of contactors to be arranged thereto and having a thin connection thickness. SOLUTION: The contact terminal, used for connecting to electrodes of a semiconductor package, has contactors contacting with the electrodes of the package; substrate electrodes holding the contactors at their top parts; and a substrate disposing the substrate electrodes thereon. Each of the contactors has a spring structure to be deformed depending on a shape of each electrode of the package by being contacted with the electrode. Each of the substrate electrode has a cavity or a groove at its center so as to allow the spring of the contactor stroke, or to allow the electrode of the package being inserted into the substrate electrode. COPYRIGHT: (C)2006,JPO&NCIPI
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申请公布号 |
JP2006012427(A) |
申请公布日期 |
2006.01.12 |
申请号 |
JP20040183363 |
申请日期 |
2004.06.22 |
申请人 |
SUMITOMO ELECTRIC IND LTD |
发明人 |
KAWASE KAZUNORI;MIURA KOSUKE;HAGA TAKESHI |
分类号 |
H01R13/24;G01R1/067;H01L23/32;H01R43/02 |
主分类号 |
H01R13/24 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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