发明名称 CONTACT TERMINAL, ITS MANUFACTURING METHOD, PROBE CARD EQUIPPED WITH THE CONTACT TERMINAL, AND ELECTRONIC DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a contact terminal having a small number of contactors to be arranged thereto and having a thin connection thickness. SOLUTION: The contact terminal, used for connecting to electrodes of a semiconductor package, has contactors contacting with the electrodes of the package; substrate electrodes holding the contactors at their top parts; and a substrate disposing the substrate electrodes thereon. Each of the contactors has a spring structure to be deformed depending on a shape of each electrode of the package by being contacted with the electrode. Each of the substrate electrode has a cavity or a groove at its center so as to allow the spring of the contactor stroke, or to allow the electrode of the package being inserted into the substrate electrode. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006012427(A) 申请公布日期 2006.01.12
申请号 JP20040183363 申请日期 2004.06.22
申请人 SUMITOMO ELECTRIC IND LTD 发明人 KAWASE KAZUNORI;MIURA KOSUKE;HAGA TAKESHI
分类号 H01R13/24;G01R1/067;H01L23/32;H01R43/02 主分类号 H01R13/24
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