发明名称 CHARACTERIZATION AND COMPENSATION OF ERRORS IN MULTI-AXIS INTERFEROMETRY SYSTEM
摘要 In general, in one aspect, the invention features a method that includes monitoring a position of a stage (140) along a first measurement axis and a second measurement axis of a multi-axis interferometry system and determining a position of the stage (140) with respect to another degree of freedom based on the monitored positions along the first and second axes and predetermined information about how the measurement axes deviate from being parallel to one another.
申请公布号 WO2005045529(A3) 申请公布日期 2006.01.05
申请号 WO2004US36637 申请日期 2004.11.04
申请人 ZYGO CORPORATION;HILL, HENRY, A. 发明人 HILL, HENRY, A.
分类号 G01B9/02;G03F7/20;G03F9/00;(IPC1-7):G03F7/20 主分类号 G01B9/02
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