发明名称 OPERATION MEASURING APPARATUS FOR INTEGRATED CIRCUIT
摘要 PROBLEM TO BE SOLVED: To solve the problem, wherein when measuring signals or the like at input/output terminals of an integrated circuit having a large number of terminals, measuring the terminals of an operation measuring apparatus are easy to short-circuit the terminals of the integrated circuit. SOLUTION: The operation measuring apparatus is equipped with connection terminals 2, which respectively contact with a plurality of input/output terminals (c) of the integrated circuit (a); fixed contact members 5 which are connected to the connection terminals 2 respectively; a movable contact member 23, which can be electrically connected to one fixed contact member 5 selected from among a plurality of fixed contact members 5; and a measurement terminal 24 which is connected to the movable contact member 23. As a result, the measurement terminal 24 can be electrically connected to an arbitrary terminal c of the integrated circuit via the movable contact member 23, and the one fixed contact member 5 can be connected to the movable contact member 23, and one connection terminal 23. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2005345367(A) 申请公布日期 2005.12.15
申请号 JP20040167458 申请日期 2004.06.04
申请人 ORION DENKI KK 发明人 SETOGAWA TAKASHI;KAWAHARA SATOSHI
分类号 G01R31/26;(IPC1-7):G01R31/26 主分类号 G01R31/26
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