发明名称 PROBE FOR LARGE CURRENT
摘要 PROBLEM TO BE SOLVED: To provide a probe for large current that prevents breakage by degradation, by minimizing current density and contact resistances, while improving the reliability of inspections. SOLUTION: The probe comprises a cylindrical outer tube with opened upper and lower ends, a plunger elastically appearanceably arranged at the upper portion of the outer tube, which contacts the contacting terminal of an object to be inspected, contacting members engaged with the lower portion of the outer tube and electrically communicating with the contacting terminal of a circuit board, and a number of contacting wires intervened at engaged portion between the plunger and the contacting members for electrically communicating between the plunger and the contacting members, and then their ends are projected from the engaged portion to the outside and bent. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2005331500(A) 申请公布日期 2005.12.02
申请号 JP20040350776 申请日期 2004.12.03
申请人 LEENO IND INC 发明人 LEE CHAE YOON
分类号 G01R1/067;G01R31/02;(IPC1-7):G01R1/067 主分类号 G01R1/067
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