发明名称 |
Planarisierungsvorrichtung |
摘要 |
A polishing stage (22) is mounted on a body (12) provided with a rough grinding stage (18) and a fine grinding stage (20) so that a wafer (28) can be roughly ground, finely ground and polished in one planarization apparatus (10). The planarization apparatus (10) also has a cleaning stage (23) for cleaning a polishing pad (56) of the polishing stage (22) to thereby clean the dirty cleaning pad (56). The planarization apparatus (10) is also provided with an etching unit (150, 190) to thereby perform a sequence of planarization from the rough grinding to the etching. <IMAGE> |
申请公布号 |
DE60020614(T2) |
申请公布日期 |
2005.12.01 |
申请号 |
DE2000620614T |
申请日期 |
2000.01.03 |
申请人 |
TOKYO SEIMITSU CO. LTD., MITAKA |
发明人 |
ISHIKAWA, TOSHIHIKO;KATAGIRI, YASUSHI |
分类号 |
B24B7/00;B24B7/22;B24B37/00;B24B37/04;B24B37/30;B24B49/04;B24B53/017;H01L21/304;H01L21/306;H01L21/683;(IPC1-7):B24B7/22;B24B53/007 |
主分类号 |
B24B7/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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