发明名称 |
METHOD AND DEVICE FOR MEASURING WHETHER A PROCESS KIT PART MEETS A PRESCRIBED TOLERANCE |
摘要 |
A go no-go gauge and method for verifying whether a process kit part used within a plasma chamber of a plasma processing tool has accumulated excessive wear or deposits. The gauge includes a component for verifying whether a dimension of a process kit part feature violates a prescribed size tolerance, the violation indicating that the process kit part has accumulated excessive wear or deposits. |
申请公布号 |
WO2005114091(A2) |
申请公布日期 |
2005.12.01 |
申请号 |
WO2005US03024 |
申请日期 |
2005.01.27 |
申请人 |
TOKYO ELECTRON LIMITED;FINK, STEVEN, T. |
发明人 |
FINK, STEVEN, T. |
分类号 |
G01B3/00;G01B3/50;G01M99/00 |
主分类号 |
G01B3/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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