发明名称 METHOD AND DEVICE FOR MEASURING WHETHER A PROCESS KIT PART MEETS A PRESCRIBED TOLERANCE
摘要 A go no-go gauge and method for verifying whether a process kit part used within a plasma chamber of a plasma processing tool has accumulated excessive wear or deposits. The gauge includes a component for verifying whether a dimension of a process kit part feature violates a prescribed size tolerance, the violation indicating that the process kit part has accumulated excessive wear or deposits.
申请公布号 WO2005114091(A2) 申请公布日期 2005.12.01
申请号 WO2005US03024 申请日期 2005.01.27
申请人 TOKYO ELECTRON LIMITED;FINK, STEVEN, T. 发明人 FINK, STEVEN, T.
分类号 G01B3/00;G01B3/50;G01M99/00 主分类号 G01B3/00
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