| 摘要 |
<p>Method of calibrating a sample peak pattern (S1,S2,S3,S4) with regard to first and second calibration peak patterns (L1,L2), wherein the respective peak patterns are acquired at different times and comprise a first reference peak (LM) and at least one second reference peak (LP1,..,LPn), the method comprising: aligning at least one second reference peak of the first calibration peak pattern with at least one corresponding second reference peak of the second calibration peak pattern; interpolating the respective positions of the first reference peaks in the first and second calibration peak patterns, in order to derive a time dependence of the position of the first reference peak; aligning the sample peak pattern relative to the calibration peak patterns such that the first reference peak of the sample peak pattern is aligned with an interpolated position (33,34,35,36) of the first reference peak obtained using the derived time dependence, and that at least one of the second reference peaks of the sample peak pattern is aligned with the corresponding second reference peak of the calibration peak patterns. <IMAGE></p> |
