发明名称 Table of wafer polishing apparatus, method for polishing semiconductor wafer, and method for manufacturing semiconductor wafer
摘要 A table for a wafer polishing apparatus having superior heat-resistant, anti-thermal-shock, and anti-abrasion characteristics and capable of increasing the diameter of a semiconductor wafer while improving the quality of the wafer. The table includes a plurality of superimposed bases each of which is formed of silicide ceramic or carbide ceramic. The bases are joined together by an adhesive layer. A fluid passage is formed in a joining interface between the bases.
申请公布号 US2005260938(A1) 申请公布日期 2005.11.24
申请号 US20050192846 申请日期 2005.07.28
申请人 发明人 OKUDA YUJI;JIMBO NAOYUKI;MAJIMA KAZUTAKA;TSUJI MASAHIRO;TAKAGI HIDEKI;ISHIKAWA SHIGEHARU;YASUDA HIROYUKI
分类号 B24B1/00;B24B37/015;B24B37/04;B24B37/12;B24B37/14;B24B37/16;B24B41/047;B24B49/14;(IPC1-7):B24B1/00 主分类号 B24B1/00
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