发明名称 Drive circuit for a power semiconductor device
摘要 A drive circuit for a power semiconductor device includes: a sampling signal generating circuit for detecting that an input control signal instructs OFF and outputting a sampling signal at the time instant of start of a Miller period of time of an IGBT; a gate voltage detecting circuit for detecting a Miller voltage of the IGBT at the timing when the sampling signal is inputted and outputting, when the Miller voltage is equal to or larger than a threshold, an over-current detection signal; and a gate voltage controlling circuit for controlling, in response to the over-current detection signal, a gate voltage of the IGBT in such a way that the IGBT is turned OFF at slower speed than in the normal state. Thus, it is possible to suppress a surge voltage which is generated when the IGBT is turned OFF during the flow of an over-current.
申请公布号 US6967519(B2) 申请公布日期 2005.11.22
申请号 US20030345388 申请日期 2003.01.16
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 NAKAYAMA YASUSHI;OHI TAKESHI;HASHIDO RYUICHI
分类号 H02M1/00;H02M1/08;H03K17/0812;H03K17/16;(IPC1-7):H03K17/30 主分类号 H02M1/00
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