发明名称 METHOD FOR CLEANING SUBSTRATE, METHOD FOR MANUFACTURING SUBSTRATE, AND DEVICE FOR CLEANING SUBSTRATE
摘要 PROBLEM TO BE SOLVED: To provide a method for cleaning a substrate which scarcely results in cleaning unevenness in a cleaning step and also damage in a substrate layer of an alignment film, a method for manufacturing a substrate including such a cleaning method, and to prevent a device for cleaning a substrate. SOLUTION: Disclosed is the method for cleaning a substrate with an alignment film, the method for manufacturing a substrate including such a cleaning method, or a device for cleaning such a substrate, and steps (A) to (D) described below or a device for performing them is included. The steps comprise: (A) forming the alignment film on the top surface of the substrate; (B) rubbing the top surface of the alignment film; (C) bringing the substrate with the alignment into contact with the water in a water tank containing the water by a prescribed amount on the whole; and (D) subjecting the substrate with the alignment film to shower and/or ultrasonic wave washing processing. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2005309180(A) 申请公布日期 2005.11.04
申请号 JP20040127735 申请日期 2004.04.23
申请人 SEIKO EPSON CORP 发明人 NAKINO SHIRO;HASEGAWA SATOSHI
分类号 G02F1/13;B08B3/02;B08B3/08;B08B3/12;G02F1/1333;G02F1/1337;(IPC1-7):G02F1/13;G02F1/133 主分类号 G02F1/13
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