发明名称 Semiconductor device and manufacturing method thereof
摘要 A stacked-type semiconductor device has a reduced overall height and an improved reliability in the mechanical strength of the stacked structure. The semiconductor device also has an improved heat release characteristic. A first interposer has a surface on which first electrode pads are formed and a first semiconductor element is mounted with a circuit forming surface facing the first interposer. A second interposer has a surface on which second electrode pads are formed and a second semiconductor element is mounted with a circuit forming surface facing the second interposer. External connection terminals are provided on a surface of the second interposer opposite to the surface on which the second semiconductor element is mounted. The first and second interposers are electrically connected to each other by conductive members provided therebetween. A back surface of the first semiconductor element and a back surface of the second semiconductor element are fixed to each other by an adhesive.
申请公布号 US6960827(B2) 申请公布日期 2005.11.01
申请号 US20040817808 申请日期 2004.04.06
申请人 FUJITSU LIMITED 发明人 NISHIMURA TAKAO;UNO TADASHI;ONODERA HIROSHI;TAKASHIMA AKIRA
分类号 H01L25/18;H01L25/065;H01L25/07;H01L25/10;H01L25/11;(IPC1-7):H01L23/34 主分类号 H01L25/18
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