发明名称 METHOD AND SYSTEM FOR TEMPERATURE CONTROL OF A SUBSTRATE
摘要 A substrate holder for supporting a substrate in a processing system and controlling the temperature thereof is described. The substrate holder (120) comprises a first heating element (130) positioned in a first region for elevating the temperature of the first region. A second heating elemen (140) positioned in a second region is configured to elevate the temperature in the second region. Furthermore, a first controllably insulating element (150) is positioned below the first heating element, and is configured to control the transfer of heat between the substrate and at least one cooling element (170) positioned therebelow in the first region. A second controllably insulating element (160) is positioned below the second heating element and is configured to control the transfer of heat between the substrate and at least one cooling element positioned therebelow in the second region.
申请公布号 WO2004095531(A3) 申请公布日期 2005.10.27
申请号 WO2004US06078 申请日期 2004.03.17
申请人 TOKYO ELECTRON LTD;MITROVIC, ANDREJ 发明人 MITROVIC, ANDREJ
分类号 H01L21/00 主分类号 H01L21/00
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