发明名称 METHOD AND INSTRUMENT FOR MEASURING HIGH-FREQUENCY ELECTRIC CHARACTERISTIC OF ELECTRONIC COMPONENT, AND METHOD FOR CALIBRATING HIGH-FREQUENCY ELECTRICAL CHARACTERISTIC MEASURING INSTRUMENT
摘要 <p>A signal conductor (12a) having one open end and a ground conductor (12b) are connected to respective measuring ports of a measuring instrument (20). At least at three points of the signal conductor (12a) in the longitudinal direction, a short-circuit reference (10) is connected between the signal conductor (12a) and the ground conductor (12b) and electrical characteristics are measured in order to calculate the error factor of the measuring system including the transmission line. An electronic component (17) to be measured is connected between the signal conductor (12a) and the ground conductor (12b) and electrical characteristics are measured. The error factor of the measuring system is removed from the measurements of the electronic component (17), thus determining the true values of the electrical characteristics of the electronic component (17). A high-precision high-frequency electrical characteristic measuring method by reflection technique insusceptible to variation in connection can thereby be realized.</p>
申请公布号 WO2005101035(A1) 申请公布日期 2005.10.27
申请号 WO2004JP19087 申请日期 2004.12.21
申请人 MURATA MANUFACTURING CO.,LTD.;KAMITANI, GAKU 发明人 KAMITANI, GAKU
分类号 G01R27/28;G01R27/26;G01R27/32;G01R31/28;G01R35/00;(IPC1-7):G01R27/26 主分类号 G01R27/28
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