发明名称 Methods of forming a capacitor with an amorphous and a crystalline high K capacitor dielectric region
摘要 The invention comprises integrated circuitry and to methods of forming capacitors. In one implementation, integrated circuitry includes a capacitor having a first capacitor electrode, a second capacitor electrode and a high K capacitor dielectric region received therebetween. The high K capacitor dielectric region has a high K substantially amorphous material layer and a high K substantially crystalline material layer. In one implementation, a capacitor forming method includes forming a first capacitor electrode layer over a substrate. A substantially amorphous first high K capacitor dielectric material layer is deposited over the first capacitor electrode layer. The substantially amorphous high K first capacitor dielectric material layer is converted to be substantially crystalline. After the converting, a substantially amorphous second high K capacitor dielectric material layer is deposited over the substantially crystalline first high K capacitor dielectric material layer. A second capacitor electrode layer is formed over the substantially amorphous second high K capacitor dielectric material layer.
申请公布号 US6953721(B2) 申请公布日期 2005.10.11
申请号 US20010797899 申请日期 2001.03.01
申请人 MICRON TECHNOLOGY, INC. 发明人 AGARWAL VISHNU K.
分类号 H01L21/02;H01L21/314;H01L21/316;H01L21/8242;(IPC1-7):H01G4/08;H01G4/30 主分类号 H01L21/02
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