发明名称 TEST APPARATUS
摘要 A printed board inspecting apparatus includes: an input unit for inputting a pulse from a first signal line; a receiving unit for receiving a voltage induced in a second signal line in response to the input pulse inputted; and a judging unit for judging whether or not a ratio between a voltage of the input pulse and the voltage induced in the second signal line is within a predetermined range. A check is made using a TDR method to determine whether or not the degree of coupling is within a range of specified values and a check is made to determine each of the voltage of the polarized RZ signal and the pulse width time is within a range of specified values to thereby inspect a printed board and a semiconductor chip constituting a bus using a directional coupler.
申请公布号 KR100512218(B1) 申请公布日期 2005.09.05
申请号 KR20020046496 申请日期 2002.08.07
申请人 发明人
分类号 G01R5/00;G01R31/02;G01R31/11;G01R31/28;(IPC1-7):G01R5/00 主分类号 G01R5/00
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