SECONDARY COPPER ION MEASURING PROBE AND MEASURING METHOD OF SECONDARY COPPER ION USING THE SAME

摘要

PROBLEM TO BE SOLVED: To provide a secondary copper ion measuring probe having high selectivity to secondary copper ions, and capable of measuring secondary copper ions with high sensitivity, and to provide a measuring method of secondary copper ions using the probe. SOLUTION: This secondary copper ion measuring probe comprises a specific sulfur-containing carbonyl compound shown by formula [VI]. This measuring method of secondary copper ions in a specimen includes measurement of absorbance or fluorescence of the probe bonded to secondary copper ions in the specimen by bringing the secondary copper ion measuring probe into contact with the specimen containing secondary copper ions. COPYRIGHT: (C)2005,JPO&NCIPI