发明名称 TRIMMING METHOD OF RESISTANCE ELEMENT AND PROBE UNIT
摘要 <p><P>PROBLEM TO BE SOLVED: To enable trimming even to a miniaturized resistance element 5 while practically measuring four terminals. <P>SOLUTION: In the trimming method of the resistance element 5, a resistor 2 and an electrode 1 are arranged alternately and the resistance value is adjusted while practically measuring the resistance value by using a probe unit 7 to a group of resistance elements continued in a series connection state. A probe pin 3 for energization of the probe unit 7 is brought into contact with the electrode 1 positioned in both ends of the resistance element group, a probe pin 4 for voltage measurement of the probe unit 7 is brought into contact with each of all the electrodes 1 of the resistance element group, a terminal-to-terminal voltage (V) of each resistance element 5 is measured while making a constant current (I) flow by the probe pin 3 between the electrodes 1 positioned in both ends of the resistance element group and a trimming means is implemented to each resistor 2 and/or the electrode 1 so that V is a prescribed value. <P>COPYRIGHT: (C)2005,JPO&NCIPI</p>
申请公布号 JP2005150580(A) 申请公布日期 2005.06.09
申请号 JP20030388838 申请日期 2003.11.19
申请人 MINOWA KOA INC 发明人 AMAMIYA HITOSHI;FUJIMOTO KOJI
分类号 H01C17/22;(IPC1-7):H01C17/22 主分类号 H01C17/22
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