| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor testing circuit which can easily perform expected value comparison at the time of a monitoring operation, without making the stress decrease, at the burn-in time, and moreover, can decrease the number of necessary I/O terminals at the burn-in. SOLUTION: A scan operating control signal for controlling the scanning operation, scan data for test, and a standard clock are supplied to a scan-designed semiconductor circuit. In the semiconductor test circuit, which performs the monitoring operation of an output of a final stage in a scan chain at the burn-in test, a scan shift operation and a scan-capturing operation are performed alternatively at the time of the burn-in, based on a monitoring control signal and a monitoring control signal input terminal which inputs the monitoring control signal which shows whether the monitoring operation is carried out from outside of the semiconductor test circuit. At monitoring of operation, a scan operation control signal selection output circuit, which outputs the scan operation control signal so that the scan shift operation is to be performed, is prepared. COPYRIGHT: (C)2005,JPO&NCIPI
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