发明名称 Semiconductor memory device with high-speed sense amplifier
摘要 In a Vss precharge scheme, dummy cells including a bit line contact, a storage node contact and a third contact connected to a Vccs power supply line are arranged in complementary bit lines. In a waiting state, H level data is written in each dummy cell from the Vccs power supply line. Before row activation is started and a normal word line is selected, a dummy word line is driven to a selected state, and the H level data is read from each dummy cell. Therefore, charge in equal amounts is injected to the complementary bit lines, and a shift from a Vss level to the same potential occurs. A sense amplifier uses the potential as a reference voltage to amplify and detect a potential difference between bit lines.
申请公布号 US6898137(B2) 申请公布日期 2005.05.24
申请号 US20030403009 申请日期 2003.04.01
申请人 RENESAS TECHNOLOGY CORP. 发明人 ARIMOTO KAZUTAMI;SHIMANO HIROKI
分类号 H01L27/108;G11C7/06;G11C7/12;G11C7/14;G11C11/401;G11C11/4091;G11C11/4099;H01L21/8242;(IPC1-7):G11C7/02 主分类号 H01L27/108
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