发明名称 Production managing system of semiconductor device
摘要 A production managing system for semiconductor devices includes, in a semiconductor producing center C, production devices 11a-11c for producing semiconductor devices, in-line measuring devices 12a-12c for measuring data of a lot, a database 2 storing data of production methods, the measured data, the specifications of the process steps corresponding to the measured data, the estimated yield, the data of lot input date and hour, the data of the scheduled date on which the process step is performed, the data of actual date of completion in every step and the data of the scheduled date of completion of the semiconductor devices of every lot, correspondingly to a lot number data of the semiconductor devices (chips) and a server 1 including an estimated yield operating unit 1 a for calculating the estimated yield, which is a final yield, on the basis of the specifications and the measured data, and a production managing unit 1b for performing a production management of semiconductor devices ordered by a user on the basis of the respective data inputted by the user and the estimated yield, wherein a user terminal of the user not only performs a determination whether or not the process processing in every process is normal but also estimates the final number of normal products ordered by the user and obtainable finally.
申请公布号 US2005106803(A1) 申请公布日期 2005.05.19
申请号 US20040005330 申请日期 2004.12.06
申请人 YAMADA KEIZO;ITAGAKI YOUSUKE;USHIKI TAKEO;TSUJIDE TOHRU 发明人 YAMADA KEIZO;ITAGAKI YOUSUKE;USHIKI TAKEO;TSUJIDE TOHRU
分类号 H01L21/02;H01L21/00;(IPC1-7):H01L21/20 主分类号 H01L21/02
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