发明名称 Non-volatile memory and manufacturing method using STI trench implantation
摘要 A method for manufacturing an integrated circuit structure includes providing a semiconductor substrate and forming two trenches in the semiconductor substrate to define an active region therebetween. An implanted source region is formed in one of the trenches on one side of the active region. An implanted drain region is formed in the other trench on the other side of the active region. Shallow trench isolations are then formed in the trenches. One or more gates are formed over the active region, and contacts to the implanted source region and the implanted drain region are formed.
申请公布号 US2005101102(A1) 申请公布日期 2005.05.12
申请号 US20030703289 申请日期 2003.11.06
申请人 CHARTERED SEMICONDUCTOR MANUFACTURING LTD. 发明人 CHAN TZE HO S.;LI WEINING;QUEK ELGIN;ZHENG JIA Z.;YELEHANKA PRADEEP RAMACHANDRAMURTHY;LAI TOMMY
分类号 H01L21/336;H01L21/762;H01L21/8247;H01L27/115;(IPC1-7):H01L21/76 主分类号 H01L21/336
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