| 摘要 |
PROBLEM TO BE SOLVED: To provide a selecting method of IDDQ measuring point for making an IDDQ test possible sufficiently to determine a fault of an integrated circuit that has not negligible quantity for the amount of the increase of amperage caused by the fault. SOLUTION: With reference to a fault dictionary, two or more IDDQ measuring point candidates' number of detected faults is computed, and at least one IDDQ measuring point candidate that becomes the maximum in the number of detected faults is selected and saved at an IDDQ measuring point information storage part. Together with the selected IDDQ measuring point, the number of new detected faults and the total number of duplication detected faults are computed for two or more IDDQ measuring point candidate of every which were not selected. At least one IDDQ measuring point candidate is selected so that the difference between the number of new detected faults and the total number of duplication detected faults becomes the maximum, and it is saved at the IDDQ measuring point information storage part. A fault detection rate is computed from the IDDQ measuring point saved at the IDDQ measuring point information storage part, repeating the execution of the process until reaching a predetermined fault detection rate. COPYRIGHT: (C)2005,JPO&NCIPI
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