发明名称 Capacitor, semiconductor device having the same, and method of manufacturing the semiconductor device
摘要 A semiconductor device with a stack type capacitor having a lower electrode formed of an aluminum-doped metal, and a manufacturing method thereof are provided. The semiconductor device includes: a semiconductor substrate having a gate structure and an active region; an interlayer dielectric film formed on the active region; a lower electrode formed of a metal containing aluminum on the interlayer dielectric film; a dielectric layer formed on the lower electrode; an upper electrode formed on the dielectric layer; and a plug formed in the interlayer dielectric film to electrically connect the active region with the lower electrode. The method includes: forming a gate structure and an active region on a semiconductor substrate; forming an interlayer dielectric film on the resultant semiconductor substrate; forming a plug in the interlayer dielectric film to electrically connect with the active region; forming a mold oxidation layer on the plug and the interlayer dielectric film; patterning the mold oxidation layer with a predetermined pattern and forming a lower electrode of material containing aluminum on the plug; and sequentially forming a dielectric layer and an upper electrode on the lower electrode.
申请公布号 US2005087789(A1) 申请公布日期 2005.04.28
申请号 US20040902824 申请日期 2004.08.02
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 BAIK HION-SUCK;LEE JUNG-HYUN;PARK JONG-BONG;PARK YUN-CHANG
分类号 H01L27/108;H01L21/02;H01L21/285;H01L21/8242;(IPC1-7):H01L21/44 主分类号 H01L27/108
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