| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit for processing a signal outputted from an image sensor that facilitates color matching for a DAC and a display section or the like connected to the post-stage and accurately evaluates image quality deterioration in a lens and the image sensor. SOLUTION: The semiconductor integrated circuit includes: a first signal processing means 30 for applying first signal processing to image data obtained on the basis of a signal outputted from at least one image sensor; a storage means 50 for storing data with respect to production of a test chart; a chart generating means 40 for generating image data denoting the test chart on the basis of the data stored in a storage means; and second signal processing means 70 to 100 for applying second signal processing to the image data subjected to the first signal processing by the first signal processing means or the image data generated by the chart generating means. COPYRIGHT: (C)2005,JPO&NCIPI
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