| 发明名称 |
Method and apparatus for testing electronic devices |
| 摘要 |
An apparatus including a circuit substrate having a plurality of contactor pins extending between two opposing surfaces; and at least one capacitor mounted on one of the two opposing surfaces of the circuit substrate.
|
| 申请公布号 |
US6885207(B2) |
申请公布日期 |
2005.04.26 |
| 申请号 |
US20030439366 |
申请日期 |
2003.05.16 |
| 申请人 |
INTEL CORPORATION |
发明人 |
CHAN KOK HONG;LIM CHU AUN;FONG TARK WOOI |
| 分类号 |
G01R1/04;G01R1/073;(IPC1-7):G01R31/02 |
主分类号 |
G01R1/04 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
|
| 地址 |
|
