发明名称 OPTICAL LITHOGRAPHY METHOD FOR PATTERNING LINES OF SUBSTANTIALLY EQUAL WIDTH
摘要 A composite patterning technique may include two lithography processes. A first lithography process may use interference lithography to form a continuous pattern of lines of substantially equal width on a photoresist. A second lithography process may use one or more non-interference lithography techniques, such as optical lithography, imprint lithography and electron-beam lithography, to break continuity of the patterned lines and form desired integrated circuit features.
申请公布号 WO2005036274(A2) 申请公布日期 2005.04.21
申请号 WO2004US33070 申请日期 2004.10.06
申请人 INTEL CORPORATION 发明人 BORODOVSKY, YAN
分类号 G03F7/20 主分类号 G03F7/20
代理机构 代理人
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