发明名称 Testing method and testing device for semiconductor integrated circuits
摘要 The set values of the base power supply voltages are divided between 10 [V] and 0 [V], the upper limit value and the lower limit value of the drive voltage specification of a liquid crystal driver. A base power supply potential difference of 10 [V] between V1 to V2 of the base power supply terminals can be generated. By taking the gradation levels included between V1 to V2 of these base power supply terminals as test objects, each of the neighboring gradation output levels can mutually have a potential difference of about 200 [mV] (base power supply potential difference between the terminals 10000 [mV]/51 gradation levels). For the gradation levels included between these base power supply terminals, for every gradation level, test is performed while changing sequentially the input data and the setting of the judgment level of the comparator, and the gradation levels included in this interval are all tested.
申请公布号 US6879174(B2) 申请公布日期 2005.04.12
申请号 US20010941683 申请日期 2001.08.30
申请人 SHARP KABUSHIKI KAISHA 发明人 UCHIDA REN
分类号 G01R31/316;G01R31/28;G01R31/3183;G02F1/133;H01L21/822;H01L27/04;H03M1/10;H03M1/76;(IPC1-7):G01R31/26;G09G3/36 主分类号 G01R31/316
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