发明名称 |
Apparatus and method for detecting and rejecting high impedance failures in chip interconnects |
摘要 |
A method and corresponding apparatus for detecting and rejecting high impedance failures in chip interconnects use monitoring circuitry on a chip to provide accurate and pro-active prediction of interconnect failures. The apparatus may include a resistance continuity monitoring circuit (RCMC), and a signal path connecting a representative set of pins to the RCMC. The RCMC measures the resistance of a connection of the representative set of pins with a circuit board during system operation and outputs a measured resistance data. The apparatus further includes additional analog-to-digital (A/D) hardware to perform an analog to digital conversion of the measured resistance data. Additional on-chip circuitry and/or microcode may be used to perform an algorithm on the digital resistance data to generate an interconnect status signal. For example, the method may output a failure signal when the measured resistance data exceeds a threshold resistance value. The apparatus further includes a system interface to send the interconnect status signal to other system management devices.
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申请公布号 |
US6879173(B2) |
申请公布日期 |
2005.04.12 |
申请号 |
US20030453612 |
申请日期 |
2003.06.04 |
申请人 |
HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P. |
发明人 |
BARR ANDREW H.;POMARANSKI KEN G.;SHIDLA DALE J. |
分类号 |
G01R31/04;G01R31/28;(IPC1-7):G01R31/28 |
主分类号 |
G01R31/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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