发明名称 TRANSMISSION ELECTRON MICROSCOPE SYSTEM AND INSPECTION METHOD USING THE SAME
摘要 PROBLEM TO BE SOLVED: To stably and efficiently perform existence determination and assortment determination about viruses or germs included in a specimen independently of observers, and to rapidly specify germs, etc. even if they are of new kinds by utilizing a database constructed in a geographically distant place. SOLUTION: A microscope for observing the specimen is provided with a means for accessing the database stored with names of minute objects such as viruses, pre-treatment methods for observing them, imaging conditions, imaged image data, etc. The specimen is imaged according to a pre-treatment method and to imaging conditions retrieved from the database by the titles, etc. of minute objects needing to be determined. An image thus obtained is compared with an image in the database, thereby determining the minute objects in the specimen. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005083841(A) 申请公布日期 2005.03.31
申请号 JP20030314909 申请日期 2003.09.08
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 NAKAGAKI AKIRA;TAKAGI YUJI;OKUDA HIROTO;KAKIBAYASHI HIROSHI
分类号 G01N23/04;G01N33/48;(IPC1-7):G01N23/04 主分类号 G01N23/04
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