| 摘要 |
An apparatus and a method for measuring jitters are provided to enhance accuracy of jitter measurement by generating the jitter by a difference between a function using rising edges of rectangular pulses and a linear regression function. An apparatus for measuring jitters is used for measuring equipment such as an oscilloscope and includes a rising edge detector, a rising edge detecting function generator, a regression linear function generator, a jitter calculator, and a jitter display. The rising edge detector(10) compares a rectangular pulse with a predetermined reference voltage to detect rising edges. The rising edge detecting function generator(11) generates a function which corresponds to the detected rising edges. The regression linear function generator(12) performs linear regression analysis on the generated function. The jitter calculator(13) compares the rising edge detecting function with the linear regression function to determine the jitter. The jitter display(14) displays the calculated jitter.
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