发明名称 APPARATUS AND THE METHOD FOR MAGNETIC NON-DESTRUCTIVE INSPECTION
摘要 A magnetic non-destructive inspection apparatus and a method therefor are provided to inspect an object within a short period of time and to improve discrimination by magnifying a signal inspected in a shorted position. A magnetic non-destructive inspection apparatus includes a coil(110) adjacent to an inspection panel generating a magnetic field. A signal generating device(100) applies current to the coil(110). A connector electrically makes contact with a shorting bar(120) of the inspection panel. An amplifier(130) amplifies a signal generated when the inspection panel is scanned by means of the magnetic field generated from the coil(110). The signal generating device(100) generates direct current, alternating current or pulse current, and induces an electromagnetic field at the inspection panel by applying current at the coil(110).
申请公布号 KR20050027328(A) 申请公布日期 2005.03.21
申请号 KR20030063554 申请日期 2003.09.15
申请人 LG ELECTRONICS INC. 发明人 JEONG, DAE HWA;KYE, JEONG IL;LEE, SEUNG MIN
分类号 G01N27/72;(IPC1-7):G01N27/72 主分类号 G01N27/72
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