发明名称 |
PHOTOMASK SUBSTRATE WITH IDENTIFICATION TAG, PHOTOMASK, AND IDENTIFICATION METHOD THEREFOR |
摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a photomask substrate and a photomask with an identification tag which has high visibility and can be directly processed on a photomask substrate in a short period of time without influencing the process or the quality of the mask so as to control the manufacture of the photomask, and to provide a method for efficiently identifying the information written in the tag. <P>SOLUTION: The photomask substrate has an identification tag comprising an information pattern to be used for identification and control of the photomask in the process of manufacturing a photomask. The identification tag comprises a diffraction grating written by direct processing using two-beam interference exposure of an ultrashort pulse laser in the inner region of the photomask substrate except for the surface. <P>COPYRIGHT: (C)2005,JPO&NCIPI</p> |
申请公布号 |
JP2005070490(A) |
申请公布日期 |
2005.03.17 |
申请号 |
JP20030300921 |
申请日期 |
2003.08.26 |
申请人 |
TOPPAN PRINTING CO LTD |
发明人 |
ITO NAOKO |
分类号 |
G03F1/38;H01L21/027;(IPC1-7):G03F1/08 |
主分类号 |
G03F1/38 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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