发明名称 Formation of a metal-containing film by sequential gas exposure in a batch type processing system
摘要 A method is provided for forming a metal-containing film on a substrate by a sequential gas exposure process in a batch type processing system. A metal-containing film can be formed on a substrate by providing a substrate in a process chamber of a batch type processing system, heating the substrate, sequentially flowing a pulse of a metal-containing precursor gas and a pulse of a reactant gas in the process chamber, and repeating the flowing processes until a metal-containing film with desired film properties is formed on the substrate. The method can form a metal-oxide film, for example HfO2 and ZrO2, a metal-oxynitride film, for example HfxOzNw, and HfxOzNw, a metal-silicate film, for example HfxSiyOz and ZrxSiyOz, and a nitrogen-containing metal-silicate film, for example HfxSiyOzNw and ZrxSiyOzNw. A processing tool containing a batch type processing system for forming a metal-containing film by a sequential gas exposure process is provided.
申请公布号 US2005056219(A1) 申请公布日期 2005.03.17
申请号 US20030662522 申请日期 2003.09.16
申请人 TOKYO ELECTRON LIMITED 发明人 DIP ANTHONY;TOELLER MICHAEL;REID KIMBERLY G.
分类号 C23C16/00;C23C16/30;C23C16/40;H01L;(IPC1-7):C23C16/00 主分类号 C23C16/00
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