发明名称 |
ROBOT FORK FOR TRANSFERRING WAFER HAVING WAFER SLIDING DETECTION SENSOR TO PREVENT DAMAGE OF WAFER IN WAFER TRANSFER PROCESS |
摘要 |
PURPOSE: A robot fork for transferring a wafer is provided to sense easily a sliding state of a wafer in a wafer transfer process by installing a wafer sliding detection sensor on a plate of the robot fork. CONSTITUTION: A plate is provided to load a wafer thereon. A plurality of wafer fixing rubbers(210) are installed on the plate. A wafer sliding detection sensor(250) is installed on the plate in order to sense a sliding state of the wafer loaded on the plate. The wafer sliding detection sensor is formed with a capacitor sensor. The capacitor sensor is provided to determine the sliding state of the wafer by using a difference between an output voltage in a normal state of the wafer and an output voltage in the sliding state of the wafer.
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申请公布号 |
KR20050024825(A) |
申请公布日期 |
2005.03.11 |
申请号 |
KR20030061704 |
申请日期 |
2003.09.04 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
BAEK, JUNG HWAN |
分类号 |
H01L21/68;(IPC1-7):H01L21/68 |
主分类号 |
H01L21/68 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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