发明名称 Controlling the location of conduction breakdown in phase change memories
摘要 A phase change memory may be formed in a pore of a semiconductor structure. A selected region of the pore may be processed so that breakdown in that region is either more or less likely. As a result, by reducing the variation in the location of breakdown from cell to cell and memory to memory, greater consistency can be achieved.
申请公布号 US2005032319(A1) 申请公布日期 2005.02.10
申请号 US20030633869 申请日期 2003.08.04
申请人 DODGE RICK K. 发明人 DODGE RICK K.
分类号 H01L21/265;H01L45/00;(IPC1-7):H01L21/336 主分类号 H01L21/265
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