发明名称 |
Method for Generating Test Data for functional test of data processing circuits |
摘要 |
<p>Method for generating a test procedure for testing a chip card using a computer-based design testing station. According to the method the test procedures (200, 300) are arrived at by undertaking modifications to a provided proven base test procedure (100). A display is used to display both base and derived procedures. Changes from the base test procedure are clearly highlighted in the derived procedures. The testing station automatically undertakes the reformatting required for the highlighting. Independent claims are also included for the following:- (1) a computer-based design testing station for chip cards and; (2) a computer program for setting up a test arrangement for testing the functionality of data processing circuit for producing test scripts.</p> |
申请公布号 |
EP1505399(A2) |
申请公布日期 |
2005.02.09 |
申请号 |
EP20040014616 |
申请日期 |
2004.06.22 |
申请人 |
GIESECKE & DEVRIENT GMBH |
发明人 |
POLIVAEV, DMITRY;AIGLSTORFER, ERNST |
分类号 |
G01R31/3183;(IPC1-7):G01R31/318;G06F11/263;G06F11/36 |
主分类号 |
G01R31/3183 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|