发明名称 Method for forming flowable dielectric layer in semiconductor device
摘要 The method for forming a flowable dielectric layer without micro-voids therein in a semiconductor device is employed to utilize a ultra-violet (UV) bake process. The method includes steps of: forming a plurality of patterns on a semiconductor substrate, wherein narrow and deep gaps are formed therebetween; forming a flowable dielectric layer so as to fill the gaps between the patterns; carrying out a baking process for densifying the flowable dielectric layer from a bottom face thereof; forming a plurality of contact holes by selectively etching the flowable dielectric layer; carrying out a pre-cleaning process in order to remove native oxide and impurity substances on the contact holes; and forming a plurality of contact plugs by filling a conductive material into the contact holes.
申请公布号 US2005020063(A1) 申请公布日期 2005.01.27
申请号 US20030746069 申请日期 2003.12.24
申请人 SOHN YONG-SUN 发明人 SOHN YONG-SUN
分类号 H01L21/31;H01L21/768;(IPC1-7):H01L21/44 主分类号 H01L21/31
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