发明名称 SEMICONDUCTOR DEVICE LOADING APPARATUS WITH ENHANCED LATCH MECHANISM IN TEST HANDLER
摘要 PURPOSE: A semiconductor device loading apparatus of a test handler is provided to load exactly and securely a semiconductor device on the same by using an enhanced latch mechanism. CONSTITUTION: A semiconductor device loading apparatus includes a plate, a latch and a latch operating part. The plate(501) includes a plurality of device loading members for loading a semiconductor device. The latch(521) is installed at one side of each device loading member to pressurize and depressurize an upper surface of the semiconductor device. The latch operating part is used for controlling the motion of the latch according to a corresponding state.
申请公布号 KR20040107881(A) 申请公布日期 2004.12.23
申请号 KR20030038530 申请日期 2003.06.14
申请人 MIRAE CORPORATION 发明人 KIM, SEONG BONG;LEE, GI HYEON
分类号 G01R31/26;G01R31/28;H01L21/683;(IPC1-7):H01L21/66 主分类号 G01R31/26
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